1. 제목 : Physic of Failure (PoF) Approach Used in Design for Reliability (DfR)

2. 연사 : Prof. Bongtae Han (Univ. of Maryland)

3. 일시 : 2011년 7월 15일 (금) 18:30-19:30

4. 장소 : 301동 1512-2호

5. 내용 : The shrinking development cycle time in many leading electronic industries has changed the role of analysis from problem solving to predictive mode.  The goal of the analysis is clearoptimize design, performance, and durability of a new technology product at its conceptual stage of development.  This dependency of product development on the modeling and simulation fosters increasing activity in reliability assessment and life cycle prediction. The Center for Advanced Life Cycle Engineering (CALCE) was established in 1986 and has been considered the leading research and educational institution in the area of assessing, mitigating and managing risks associated with electronic products and systems, based on Physics-of-Failure (PoF) approach. The Physics-of-Failure is the root-cause of why, where, and how materials fail under the action of different stresses.  Physical models which describe failure process at the material level are called PoF models.  In spite of its simplicity, the PoF models are often confused with the statistics based empirical models, which do not require the knowledge on root-causes of failures and related predictive physical models.This seminar will present the procedure to develop PoF models for reliability of semiconductor packaging and will describe the requirements for successful implementation of such models.  Selected examples of PoF models will be presented and the results will be discussed by comparing them with the statistics based approaches.

6. 약력 : Dr. Bongtae Han received his Ph.D. degree in Engineering Mechanics from Virginia Tech in 1991.  He is currently a Professor and a Director of Electronic Products and Systems Division of the Mechanical Engineering Department of the University of Maryland; and is directing the LOMSS (Laboratory for Optomechanics and Micro/nano Semiconductor/Photonics Systems) of CALCE (Center for Advanced Life Cycle Engineering). Dr. Han has co-authored a text book entitled "High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials", Springer-Verlag (1997) and edited two books.  He has published 8 book chapters and over 150 journal and conference papers in the field of microelectronics and experimental mechanics.  He holds 2 US patents and 4 invention disclosures. Dr. Han received the IBM Excellence Award for Outstanding Technical Achievements in 1994.  He was a recipient of the 2002 Brewer Award, presented at the Annual Conference of the SEM in Emerging Technologies.  His publication awards include the Year 2004 Best Paper Award of the IEEE Transactions on Components and Packaging Technologies, and the Gold Award (best paper in the Analysis and Simulation session) at the 1st Samsung Technical Conference in 2004.  His recent contributions to an innovative 1,500-face lumen LED luminaire, jointly developed with GE, have been recognized in a Press Release (Oct. 21, 2010, MarketWatch.com, The Wall Street Journal).  He served as an Associate Technical Editor for Experimental Mechanics, from 1999 to 2001, and has been serving as an Associate Technical Editor for Journal of Electronic Packaging, Transaction of the ASME since 2003. 

※ 문의 : 기계항공공학부 김윤영 교수 (880-7154)